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XPS studies of the adsorption characteristics of 2H-TPP at Fe/Si interface

CHHAGAN LAL1,2,3,* , G. DI SANTO2, M. CAPUTO2, M. PANIGHEL2, B. A. TALEATU4, A. GOLDONI2, I. P. JAIN5

Affiliation

  1. Department of Physics, University of Rajasthan, Jaipur – 302004, India
  2. Elettra-Sincrotrone Trieste S.C.p.A., SS 14 - km 163,5 in Area Science Park 34149 Basovizza, Trieste Italy
  3. International Centre for Theoretical Physics, Strada Costiera 11, I – 34151, Trieste Italy
  4. Department of Physics, Obafemi Awolowo University Ile-Ife, Nigeria
  5. Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur-04, India

Abstract

Porphyrinic nanomaterials have emerged as potential candidates of various applications in the fields of molecular electronics, photonics and semiconductor sensitization. There has been a great interest in utilizing supramolecular chemistry as a means to fabricate components for nanoscale devices. Metalloporphyrins control the decisive steps in various natural and technological processes which often involve the reversible attachment of a molecular ligand to the central metal ion. This work presents a study of metalation of 2H-Tetraphenylporphyrin (2H-TPP) on Fe metal films onto well reconstructed Si(111)-7× 7 surfaces. In-situ metalation reaction proceeds at 550K to form metalloporphyrin. X-ray Photoelectron Spectroscopy (XPS) studies provide evidence for the Fe coordination with TPP macrocycle and result monolayer formation of metalloporphyrin (Fe-TPP)..

Keywords

Metalloporphyrins, Metalation, Molecular ligand, XPS.

Citation

CHHAGAN LAL, G. DI SANTO, M. CAPUTO, M. PANIGHEL, B. A. TALEATU, A. GOLDONI, I. P. JAIN, XPS studies of the adsorption characteristics of 2H-TPP at Fe/Si interface, Optoelectronics and Advanced Materials - Rapid Communications, 8, 5-6, May-June 2014, pp.465-469 (2014).

Submitted at: Sept. 8, 2013

Accepted at: May 15, 2014