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Thin film characterization of novel phthalimide materials

S. ŞEN1, R. ÇAPAN2,* , M. E. ÖZEL3, A. K. HASSAN4, O. TURHAN5, H. NAMLI5

Affiliation

  1. Çanakkale Onsekiz Mart University, Faculty of Arts and Science, Physics Department, 17100 Çanakkale Turkey
  2. Balıkesir University, Faculty of Arts and Science, Physics Department, 10145 Balikesir Turkey
  3. Çağ University, Mathematic and Computer Sciences Department, 33800, Mersin Turkey
  4. Materials and Engineering Research Institute, Sheffield Hallam University, Sheffield S1 1WB, UK
  5. Balıkesir University, Faculty of Arts and Science, Chemistry Department, 10145 Balikesir Turkey

Abstract

Spin coating technique is employed to produce thin phthalimide films using novel p-phthalimidobenzoic acid (FIBA) and N-(phthalimido)-p-aminobenzoic acid (FIABA) materials. Several spin speeds and various solution concentrations are chosen to monitor the thin film deposition process of these new materials. The optical properties are studied using UV-visible spectroscopy and spectroscopic ellipsometry methods. The absorption of the FIBA and FIABA films against the spin speed showed an exponential behavior. π →π ∗ transition is occurred. The thicknesses of thin films at 2000 rpm are obtained 15.86 nm for FIBA and 12.99 nm for FIABA using spectroscopic ellipsometry results..

Keywords

Phthalimides, Spun films, UV-vis Spectroscopy, Spectroscopic ellipsometry.

Citation

S. ŞEN, R. ÇAPAN, M. E. ÖZEL, A. K. HASSAN, O. TURHAN, H. NAMLI, Thin film characterization of novel phthalimide materials, Optoelectronics and Advanced Materials - Rapid Communications, 5, 11, November 2011, pp.1243-1247 (2011).

Submitted at: Oct. 18, 2011

Accepted at: Nov. 23, 2011