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A. U. UBALE1,* , V. P. DESHPANDE1
Nanostructured thin films have attracted the attention of an increasing number of researchers from several disciplines in the last ten years due to their outstanding electronic and optical properties and due to their extensively useful applications in various optoelectronic devices. The structural, electrical and optical properties of the nanostructured ZnO thin films deposited by spray pyrolysis were investigated. The film structure and surface morphology was characterized by XRD and SEM analysis respectively. The optical properties of the film were highly affected by the smaller grain size of the material. In this study, the variation of the band gap (3.52 to 2.98 eV) and activation energy (0.5 to 0.27 eV) is represented as a function of the film thickness (86 to 235 nm). Effect of film thickness on H2S gas sensitivity was also studied..
Thin films, Nanostructures, Chemical synthesis, Electrical properties, Optical properties.
A. U. UBALE, V. P. DESHPANDE, Thickness dependent structural, electrical and optical properties of nanostructured zinc oxide thin films deposited by chemical spray technique, Optoelectronics and Advanced Materials - Rapid Communications, 5, 2, February 2011, pp.119-124 (2011).
Submitted at: Feb. 7, 2011
Accepted at: Feb. 17, 2011
Optoelectronics and Advanced Materials - Rapid Communications
(2023): 0.5 - 2023 Journal Citation Reports (Clarivate Analytics, 2024)
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