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O. M. ÖZKENDIR1,*
The electronic structure of Fe in antiferromagnetic delafossite CuFeO2 were studied by using x-ray absorption fine structure (XAFS) spectroscopy around Fe L3 absorption edge. The fundamental electronic and crystal structures of delafossite CuFeO2 are analyzed with electronic and magnetic behavior of metal iron L and K-edge. Magnetic properties of metal Fe Kedge and L2,3-edges are probed by X-ray Magnetic Circular Dichroism (XMCD) calculations. The calculations are based on different choices of one electron potentials by using the real space multiple scattering method FEFF 8.2 code.
Thin films, Electronic properties, EXAFS.
O. M. ÖZKENDIR, The electronic structure study of Fe L3 edge in CuFeO2, Optoelectronics and Advanced Materials - Rapid Communications, 3, 6, June 2009, pp.586-591 (2009).
Submitted at: Oct. 25, 2008
Accepted at: June 15, 2009
Optoelectronics and Advanced Materials - Rapid Communications
(2024): Impact Factor = 0.4 - Journal Citation Reports (Clarivate Analytics, 2025)
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