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K. J. ARUN1,* , S. JAYALEKSHMI1
L alaninium oxalate, a potential non linear optical material (NLO) has been grown by slow evaporation method at ambient temperature. The basal surfaces are examined using optical microscopy technique to understand growth and defect features which can influence the performance of a crystal for device applications. Three novel dislocation etchants are introduced and used in the present work. Etch pits of various shapes and densities are observed. Dislocation studies suggest that the crystal growth is effected by a 2D growth mechanism. Micro hardness studies are carried out to reveal the suitability of the material for device fabrication.
Crystal growth, Optical microscopy, Microstructure, Microhardness.
K. J. ARUN, S. JAYALEKSHMI, Studies on the microstructure and microhardness of L-alaninium oxalate single crystals for optical devices, Optoelectronics and Advanced Materials - Rapid Communications, 2, 12, December 2008, pp.802-805 (2008).
Submitted at: Nov. 12, 2008
Accepted at: Dec. 4, 2008
Optoelectronics and Advanced Materials - Rapid Communications
(2024): Impact Factor = 0.4 - Journal Citation Reports (Clarivate Analytics, 2025)
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