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Z. Ž. LAZAREVIĆ1,* , S. KOSTIĆ1, V. RADOJEVIĆ2, M. J. ROMČEVIĆ1, B. HADŽIĆ1, J. TRAJIĆ1, N. Ž. ROMČEVIĆ1
In this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes..
Bi12GeO20, Czochralski method, XRD, Raman spectroscopy, FTIR.
Z. Ž. LAZAREVIĆ, S. KOSTIĆ, V. RADOJEVIĆ, M. J. ROMČEVIĆ, B. HADŽIĆ, J. TRAJIĆ, N. Ž. ROMČEVIĆ, Spectroscopy study of Bi12GeO20 single crystals, Optoelectronics and Advanced Materials - Rapid Communications, 7, 1-2, January-February 2013, pp.58-61 (2013).
Submitted at: Oct. 4, 2012
Accepted at: Feb. 20, 2013
Optoelectronics and Advanced Materials - Rapid Communications
(2024): Impact Factor = 0.4 - Journal Citation Reports (Clarivate Analytics, 2025)
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