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Spatial distribution of structural and morphological features of few layered intercalated graphene

BALAJI CHANDRA1, MATHEW K. FRANCIS1, P. BALAJI BHARGAV1,* , NAFIS AHMED1, SWAYAM KESARI2, REKHA RAO2, ADITHYA JOSEPH ANTONYSAMY3

Affiliation

  1. SSN Research Centre, Sri Sivasubramaniya Nadar College of Engineering, Kalavakkam, Tamilnadu 603110, India
  2. Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai-400085, India
  3. Department of Civil and Environmental Engineering, Stanford University, California 94305, USA

Abstract

Few layered graphene (FLG) is grown using chemical vapor deposition (CVD) technique using copper (Cu) as a catalyst. Structural and morphological features of graphene layers grown for different time periods are examined using maps of various Raman intensity ratios, X-ray photoemission spectroscopy (XPS) spectrum and field emission scanning electron microscopy (FESEM) images. Average distance between defects in the grown graphene is calculated to range from 28 nm to 19 nm. Oxygen to carbon ratio in the grown graphene is estimated to be 0.18. Properties of FLG intercalated with FeCl3 are also studied.

Keywords

Graphene, CVD, Intercalation, Raman spectroscopy, FESEM, XPS.

Citation

BALAJI CHANDRA, MATHEW K. FRANCIS, P. BALAJI BHARGAV, NAFIS AHMED, SWAYAM KESARI, REKHA RAO, ADITHYA JOSEPH ANTONYSAMY, Spatial distribution of structural and morphological features of few layered intercalated graphene, Optoelectronics and Advanced Materials - Rapid Communications, 15, 11-12, November-December 2021, pp.624-631 (2021).

Submitted at: March 31, 2021

Accepted at: Nov. 24, 2021