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Research of the defect structure and colouring mechanism of black lithium tantalate wafers

QINGYAN XU1,2,3, JIASHUN SI1,2,4, SHUAIJIE LIANG1,2,4, YAN ZHANG1,2,4, YAN HUANG1,2,4, LINGLING MA1,2,4, LIANG HAI1,2,4, XUEFENG ZHANG1,3, MENGFAN WANG5, HUAN ZHANG1,2,4, XUEFENG XIAO1,2,4,*

Affiliation

  1. College of Electric and Information Engineering, North Minzu University, Yinchuan, 750021, China
  2. Key Laboratory of Physics and Photoelectric Information Functional Materials Sciences and Technology, North Minzu University, Yinchuan, 750021, China
  3. Ningxia Ju Jing Yuan Crystal Technology Company Limited, Shizuishan 753000, China
  4. Microelectronics and Solid-State Electronics Device Research Center, North Minzu University, Yinchuan, 750021, China
  5. School of Materials Science and Engineering, Zhengzhou University, Zhengzhou, 450001, China

Abstract

In this work, a chemical reduction method has been used to prepare black lithium tantalate (BLT) wafers. The defect structure and chromogenic mechanism of BLT wafers were investigated. It was found that the reduction process results in the reduction of a large amount of Ta5+ to Ta4+, and a small percentage of low valence Ta3+/2+ ions to Ta4+ or Ta5+ on the surface of lithium tantalate wafers. At the same time, it produced a large number of O vacancies. The O vacancies and structural distortion of TaO6 were the main reasons for the blackening of lithium tantalate wafers.

Keywords

Black lithium tantalate, Defect structure, Colouring mechanism, O vacancies.

Citation

QINGYAN XU, JIASHUN SI, SHUAIJIE LIANG, YAN ZHANG, YAN HUANG, LINGLING MA, LIANG HAI, XUEFENG ZHANG, MENGFAN WANG, HUAN ZHANG, XUEFENG XIAO, Research of the defect structure and colouring mechanism of black lithium tantalate wafers, Optoelectronics and Advanced Materials - Rapid Communications, 18, 3-4, March-April 2024, pp.161-168 (2024).

Submitted at: Dec. 18, 2023

Accepted at: April 8, 2024