Optoelectronic properties of nanocrystalline F-doped SnO2 (FTO) films prepared by sol-gel spin coating technique
N. SANKARASUBRAMANIAN1,
K. SANTHAKUMARI2,
V. S. VIDHYA3,
L. C. NEHRU3,
B. SUBRAMANIAN3,
A. THAYUMANAVAN4,
S. RAMAMURTHY5,
C. SANJEEVIRAJA6,
M. JAYACHANDRAN3,*
Affiliation
- Department of Physics, Thiagarajar college of Engineering, Madurai-625015, India
- Department of physics, SASTRA University, Thirumalai Samuthiram-613402, India
- ECMS Division, Central Electrochemical Research Institute, Karaikudi-630006, India
- Department of Physics, AVVM Sri Pushpam College, Poondi-613503, India
- Department of Physics, Gandhigram Rural Institute, Gandhigram-624302, India
- Department of Physics, Alagappa University, Karaikudi-630003, India
Abstract
F-doped Transparent tin oxide thin films (SnO2:F) have been prepared using the sol–gel spin coating technique. In order to
optimize the dopant concentration, sol-gel samples of different F/Sn ratios from 1.0 to 12.5 at.%, were prepared, spin
coated and heated at temperatures ranging from 325 to 450oC with an optimum number of 8 coatings. Their structural,
optoelectronic and morphological properties were investigated. The X-ray diffraction (XRD) studies showed the
nanocrystalline nature of the developed films. The films deposited at 400oC with a F/Sn ratio of 7.5 at.%, were highly
transparent in the visible region with a refractive index value of about 2.0 and have low resistivity. Surface morphological
studies by SEM and AFM images showed marked influence of F-dopant concentrations on the topography of SnO2:F films.
Keywords
Thin film, Spin coating, F doped tin oxide, Conducting oxide.
Citation
N. SANKARASUBRAMANIAN, K. SANTHAKUMARI, V. S. VIDHYA, L. C. NEHRU, B. SUBRAMANIAN, A. THAYUMANAVAN, S. RAMAMURTHY, C. SANJEEVIRAJA, M. JAYACHANDRAN, Optoelectronic properties of nanocrystalline F-doped SnO2 (FTO) films prepared by sol-gel spin coating technique, Optoelectronics and Advanced Materials - Rapid Communications, 1, 9, September 2007, pp.417-424 (2007).
Submitted at: Aug. 9, 2007
Accepted at: Aug. 15, 2007