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Optoelectronic properties of nanocrystalline F-doped SnO2 (FTO) films prepared by sol-gel spin coating technique

N. SANKARASUBRAMANIAN1, K. SANTHAKUMARI2, V. S. VIDHYA3, L. C. NEHRU3, B. SUBRAMANIAN3, A. THAYUMANAVAN4, S. RAMAMURTHY5, C. SANJEEVIRAJA6, M. JAYACHANDRAN3,*

Affiliation

  1. Department of Physics, Thiagarajar college of Engineering, Madurai-625015, India
  2. Department of physics, SASTRA University, Thirumalai Samuthiram-613402, India
  3. ECMS Division, Central Electrochemical Research Institute, Karaikudi-630006, India
  4. Department of Physics, AVVM Sri Pushpam College, Poondi-613503, India
  5. Department of Physics, Gandhigram Rural Institute, Gandhigram-624302, India
  6. Department of Physics, Alagappa University, Karaikudi-630003, India

Abstract

F-doped Transparent tin oxide thin films (SnO2:F) have been prepared using the sol–gel spin coating technique. In order to optimize the dopant concentration, sol-gel samples of different F/Sn ratios from 1.0 to 12.5 at.%, were prepared, spin coated and heated at temperatures ranging from 325 to 450oC with an optimum number of 8 coatings. Their structural, optoelectronic and morphological properties were investigated. The X-ray diffraction (XRD) studies showed the nanocrystalline nature of the developed films. The films deposited at 400oC with a F/Sn ratio of 7.5 at.%, were highly transparent in the visible region with a refractive index value of about 2.0 and have low resistivity. Surface morphological studies by SEM and AFM images showed marked influence of F-dopant concentrations on the topography of SnO2:F films.

Keywords

Thin film, Spin coating, F doped tin oxide, Conducting oxide.

Citation

N. SANKARASUBRAMANIAN, K. SANTHAKUMARI, V. S. VIDHYA, L. C. NEHRU, B. SUBRAMANIAN, A. THAYUMANAVAN, S. RAMAMURTHY, C. SANJEEVIRAJA, M. JAYACHANDRAN, Optoelectronic properties of nanocrystalline F-doped SnO2 (FTO) films prepared by sol-gel spin coating technique, Optoelectronics and Advanced Materials - Rapid Communications, 1, 9, September 2007, pp.417-424 (2007).

Submitted at: Aug. 9, 2007

Accepted at: Aug. 15, 2007