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Optical rotatory dispersion based wavemeter used in 1310 nm and 1550 nm wavebands

YONGLIANG SHEN1, HONGAN YE1, XIANLIN ZHENG1,* , CHUNYU LIU1

Affiliation

  1. School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China

Abstract

We propose a rotatory-dispersion based wavemeter, aiming to reduce the cost and complexity, and retain sufficient measurement accuracy. We have built the wavemeter in-house around very low-cost components, and the no-scanning nature leads to a compact and robust instrument. We give a description of the construction and operating principle, and provide experimental proof in two communication interesting windows. Testing experiments indicate that an absolute measurement accuracy of ±6 pm is believed to be achievable. Besides, this design allows a customizable operating waveband over visible and most of the near-infrared spectrum..

Keywords

Spectrometers and spectroscopic instrumentation, Optical systems design.

Citation

YONGLIANG SHEN, HONGAN YE, XIANLIN ZHENG, CHUNYU LIU, Optical rotatory dispersion based wavemeter used in 1310 nm and 1550 nm wavebands, Optoelectronics and Advanced Materials - Rapid Communications, 5, 12, December 2011, pp.1265-1267 (2011).

Submitted at: Nov. 12, 2011

Accepted at: Nov. 24, 2011