Modelling of the low-frequency solvent dielectric permittivity in porous silicon nanochannels in the electrical double layer length range
ANA IOANID1,*
Affiliation
- Faculty of Physics, University of Bucharest, Măgurele – Ilfov, Romania
Abstract
Electrical double layer (EDL), consists in a shielding layer that is naturally created within the liquid near a charged surface. The thickness of the EDL is given by the characteristic Debye length whole typical value ~1nm depends on the ionic contents in the solvent. The electrokinetic effects in nanochannels depend essentialy on the distribution of charged species in EDL, described by the Poisson-Boltzmann equation those solutions require the solvent dielectric permittivity. A model for solvent low-frequency permittivity profile is proposed, taking into account both the porous silicon (PS) electrode and aqueous solvent properties in the Debye length range.
Keywords
Nanochannels, Nanofluidics, Electrical double layer, Ionic strength, Low-frequency permittivity.
Citation
ANA IOANID, Modelling of the low-frequency solvent dielectric permittivity in porous silicon nanochannels in the electrical double layer length range, Optoelectronics and Advanced Materials - Rapid Communications, 3, 10, October 2009, pp.1008-1012 (2009).
Submitted at: Sept. 28, 2009
Accepted at: Oct. 2, 2009