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M. KAVOSH TEHRANI1,* , R. TOFIGH MOVALU1
In this paper, the gradient index planar microlens profile shape made by ion exchange process is determined by the semi-circular interference pattern obtained from total shearing interferometric. In the following, the focal length and half the width of the wave was calculated with simulation of Gaussian beam propagation through this planar microlens by Optiwave software. It is worth mentioning that the simulation results are in good agreement with the experimental results obtained for the profile..
Beam width, Focal length, Gaussian beam, Graded-Index Planar Microlens.
M. KAVOSH TEHRANI, R. TOFIGH MOVALU, Measuring of the refractive index profile gradient index planar microlens by numerical method, Optoelectronics and Advanced Materials - Rapid Communications, 12, 11-12, November-December 2018, pp.660-664 (2018).
Submitted at: May 2, 2018
Accepted at: Nov. 29, 2018
Optoelectronics and Advanced Materials - Rapid Communications
(2022): 0.5 - 2022 Journal Citation Reports (Clarivate Analytics, 2023)
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