Abstract
SrBi2Nb2O9 (SBN) thin films were prepared on fused quartz substrates at room temperature by RF magnetron sputtering
technique. The structure and the composition of the films were characterized by X-ray diffraction and X-ray fluorescence
spectrometry. The optical transmittance of the samples was measured and their dispersion of refractive index was found to
follow the Sellmeier-type dispersion relation. The nonlinear optical properties of the films were determined using a single
beam z-scan technique at a laser wavelength of 532 nm with duration of 25 ps. The real and imaginary parts of the
third-order nonlinear optical susceptibility χ(3) were -6.10×10-8 esu and 1.94×10-8 esu, respectively, suggesting a
self-defocusing optical nonlinearity. The results show that SBN thin films have great potential applications in nonlinear optics.
Keywords
SrBi2Nb2O9 thin films, RF magnetron sputtering, Optical transmittance, Nonlinear optical properties, Z-scan technique.
Citation
KANSONG CHEN, HAOSHUANG GU, LI XU, Linear and nonlinear optical properties of SrBi2Nb2O9 thin films fabricated by RF magnetron sputtering, Optoelectronics and Advanced Materials - Rapid Communications, 1, 9, September 2007, pp.425-429 (2007).
Submitted at: July 31, 2007
Accepted at: Aug. 15, 2007