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Investigation of the function for buffer layer in coated conductors

Y. WANG1,2, L. ZHOU1,2, Y. F. LU2,* , C. S. LI2, Z. M. YU2, L. H. JIN2, J. S. LI1

Affiliation

  1. State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
  2. Northwest Institute for Nonferrous Metal Research, Xi’an 710016, China

Abstract

We have studied the detailed function of La2Zr2O7 (LZO) and CeO2 buffer layer in coated conductors. The results reveal that there is an obvious transformation trend of the orientation for NiO phase from (111) to (00l) in all samples with the increase of oxygen partial pressure in annealing atmosphere. Moreover, it indicates that LZO possesses an effective inhibiting function to the formation of NiO compared with CeO2. Therefore, it can be considered that LZO is often fit for being as barrier layer, while CeO2 is commonly to be as cap layer in multi-layer architecture of buffer layers in coated conductors.

Keywords

Coated conductors, Buffer layer, Chemical solution deposition.

Citation

Y. WANG, L. ZHOU, Y. F. LU, C. S. LI, Z. M. YU, L. H. JIN, J. S. LI, Investigation of the function for buffer layer in coated conductors, Optoelectronics and Advanced Materials - Rapid Communications, 4, 8, August 2010, pp.1149-1153 (2010).

Submitted at: July 10, 2010

Accepted at: Aug. 12, 2010