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Intelligent modelling of alpha (α) parameter; comparison of ANN and ANFIS cases

F. V. CELEBI1,* , M. YUCEL2, H. H. GOKTAS3, K. DANISMAN4

Affiliation

  1. Department of Computer Engineering, Yıldırım Beyazıt University, Ankara, Turkey
  2. Department of Electrical-Electronics Engineering, Faculty of Technology, Gazi University, Ankara, Turkey
  3. Department of Electronics and Communication Engineering, Yıldırım Beyazıt University, Ankara, Turkey
  4. Department of Electrical-Electronics Engineering, Erciyes University, Kayseri, Turkey

Abstract

In this study, intelligent models are proposed for the Alpha (α) parameter or so called linewidth enhancement factor (LEF) which is an important parameter influencing many static, dynamic and noise characteristics of semiconductor lasers. The models are obtained with the use of artificial neural network (ANN) and adaptive neuro-fuzzy inference system (ANFIS) approaches. The proposed approaches are in very good agreement with the previously published experimental values..

Keywords

Linewidth enhancement factor, ANN, ANFIS.

Citation

F. V. CELEBI, M. YUCEL, H. H. GOKTAS, K. DANISMAN, Intelligent modelling of alpha (α) parameter; comparison of ANN and ANFIS cases, Optoelectronics and Advanced Materials - Rapid Communications, 7, 5-6, May-June 2013, pp.470-474 (2013).

Submitted at: Nov. 5, 2012

Accepted at: June 12, 2013