Fast method for determination of Cd, Cu, Pb, Se, and Zn in whole blood by DRC-ICP-MS using the simple dilution procedure
C. TĂNĂSELIA1,*
,
T. FRENŢIU2,
M. URSU1,
M. VLAD3,
M. CHINTOANU1,
E. CORDOŞ1,
L. DAVID4,
M. PAUL1,
D. GOMOIESCU1
Affiliation
- INCDO-INOE 2000, Research Institute for Analytical Instrumentation, Donath 67, Cluj-Napoca, Romania
- Babes-Bolyai University, Faculty of Chemistry and Chemical Engineering, A. Janos 11, Cluj-Napoca, Romania
- Iuliu Moldovan Institute of Public Health, Pasteur 6, Cluj-Napoca, Romania
- Babes-Bolyai University, Faculty of Physics, M. Kogălniceanu 1, Cluj-Napoca, Romania
Abstract
A fast and very sensitive method based on inductively coupled plasma mass spectrometry and Dynamic Reaction Cell
(DRC-ICP-MS) for determination of Cd, Cu, Pb, Se, and Zn in whole blood was developed by using of the reference
certified materials. After a simple dilution of the samples (1 : 9) in a diluent containing 5 g l-1 NH3, 0.5 g l-1 Triton-X, 0.5 g l-1
EDTA and 6 ml l-1 butan-1-ol, they were directly introduced by pneumatic nebulization into the plasma. Excellent
performances were achieved in reducing the polyatomic interferences on Cd, Se, and Pb isotopes through charge-transfer
mechanism by the use of both butan-1-ol in the sample and DRC technology operated with methane as reaction gas. In the
same circumstances, the results were only reasonably good for Zn and Cu. Limits of detection in undiluted whole blood
sample were in the range of 1.5 ng l-1 (for Cd and Pb) to 150 ng l-1 (for Zn). The recovery degrees compared to the certified
contents for a 95 % confidence level were: 105 ± 5 % (Cd); 102 ± 5 % (Se); 97 ± 6 % (Pb); 100 ± 11 % (Zn) and 106 ± 23 %
(Cu).
Keywords
Mass spectrometry, Dynamic reaction cell, Toxic and essential elements, Whole blood, Certified materials.
Citation
C. TĂNĂSELIA, T. FRENŢIU, M. URSU, M. VLAD, M. CHINTOANU, E. CORDOŞ, L. DAVID, M. PAUL, D. GOMOIESCU, Fast method for determination of Cd, Cu, Pb, Se, and Zn in whole blood by DRC-ICP-MS using the simple dilution procedure, Optoelectronics and Advanced Materials - Rapid Communications, 2, 2, February 2008, pp.99-107 (2008).
Submitted at: Jan. 30, 2008
Accepted at: Feb. 11, 2008