Abstract
Failure analysis of a device has an important part to play in determining the causes of device failure and ways for making
and using the devices to achieve greater reliability. Therefore an investigation was carried out for failure analyzing of
adhesive bonded optical splitter packages using thermal cycling as an acceleration method. An optical splitter module
simply composed of Y-branching waveguide devices on a substrate connected to and from optical fiber. However, it
requires a lot of different materials with different properties to package such optical splitter in a case. As the thermomechanical
properties of these different materials are normally quite different among each other, the thermal stress is
induced due to the variation in coefficient of thermal expansion (CTE), hence affecting the optical performance and longterm
reliability of the device. Therefore, an investigation was carried out to study the effect of housing on the reliability of
adhesive bonded optical splitter modules with reference to the Telcordia requirements. A significant degradation in
performance was found for the packaged splitter in housing during thermal cycling test. This is mainly due to the stressinduced
misalignment effects between the PLC chip & coupling fibers, and also fiber bending in the housing. The finite
element method (FEM) was then employed to confirm of the experimental findings. This study can provide important
dictation in the reliable packaging of optical splitter with minimizing the CTE mismatch effects.
Keywords
Optical splitter, Adhesive bonding, Reliability, Thermal cycling, Coefficient of thermal expansion (CTE) mismatch,
Insertion loss.
Citation
K. W. LAM, H. P. CHAN, M. A. UDDIN, Failure analysis of adhesive bonded planar lightwave circuit (PLC) based optical splitter packages, Optoelectronics and Advanced Materials - Rapid Communications, 3, 10, October 2009, pp.998-1004 (2009).
Submitted at: Feb. 20, 2009
Accepted at: Oct. 2, 2009