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Ellipsometric investigation of Fe-based amorphous thin films

M. DOBROMIR1,* , M. NEAGU2, H. CHIRIAC3, C. AGHEORGHIESEI2, A. BULAI2, L. VELICU2, F. BORZA3

Affiliation

  1. Sciences Department, “Alexandru Ioan Cuza” University, Carol I Blvd., 700506 Iasi, Romania
  2. Faculty of Physics, „Alexandru Ioan Cuza“ University, Carol I Blvd., 700506, Iasi Romania
  3. National Institute of Research & Development for Technical Physics, 47 Mangeron Blvd., 700050, Iasi, Romania

Abstract

FeSiB amorphous thin films deposited onto glass substrate by pulsed laser method are investigated. The used ablation target was made of Fe79Si9B12 amorphous ribbons. The refractive index, extinction coefficient, magneto-optical constant and coercive force of the deposited films have been determined by means of ellipsometry and magneto-optical ellipsometry. The measurements made at 632.8 nm wavelength give 2.3, 1.75 and 0.0177-0.0663j for n, k and Q, respectively.

Keywords

Amorphous thin films, Ellipsometry, Magneto-optical ellipsometry.

Citation

M. DOBROMIR, M. NEAGU, H. CHIRIAC, C. AGHEORGHIESEI, A. BULAI, L. VELICU, F. BORZA, Ellipsometric investigation of Fe-based amorphous thin films, Optoelectronics and Advanced Materials - Rapid Communications, 4, 11, November 2010, pp.1667-1669 (2010).

Submitted at: Nov. 3, 2010

Accepted at: Nov. 10, 2010