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Effect of working temperature on Ge-Nd2O3, Ge-Dy2O3, Ge-Eu2O3 and Ge-La2O3 TFTs

P. GOGOI1,* , K. KONWAR1, B. BAISHYA1

Affiliation

  1. Department of Physics, Dibrugarh University, Dibrugarh-786 004, Assam, India

Abstract

TFTs having Ge as active material have been fabricated with rare earth oxides Nd2O3, Dy2O3, Eu2O3 and La2O3 as gate insulator. All the TFTs are fabricated in staggered electrode structure on perfectly cleaned glass substrates using thermal evaporation process under high vacuum. Effect of different working temperature on the TFT’s characteristics has been observed and reported.

Keywords

Ge TFTs, Rare earth oxides, Working temperature.

Citation

P. GOGOI, K. KONWAR, B. BAISHYA, Effect of working temperature on Ge-Nd2O3, Ge-Dy2O3, Ge-Eu2O3 and Ge-La2O3 TFTs, Optoelectronics and Advanced Materials - Rapid Communications, 4, 5, May 2010, pp.665-667 (2010).

Submitted at: May 9, 2010

Accepted at: May 20, 2010