"

Cookies ussage consent

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

Effect of rapid thermal processing on surface plasmon resonance of Ag island films

P CHENG1, D LI2,* , D YANG2

Affiliation

  1. School of Electronic and Information Engineering, Ningbo University of Technolo g y, Ningbo, 315016 People s Republic of China
  2. State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People s Republic of China

Abstract

The effect of rapid thermal processing (RTP) on surface plasmon (SP) oscillation characteristics of Ag island film are reported in this paper. With increase of the annealing temperature, the SP resonance band showed a blue shift at first and red shift finally which can be attribute d to the morphology change of the Ag island films The SP bands of large island si ze films blue shift more in comparison with that of small islands due to their more obvious change of morphology upon annealing. By comparing the SP evolution of the Ag islands under RTP at different temperatures with those upon long time furnace annealing ( FA), it is found that the SP resonance band shifts directly to short wavelength by RTP, but the SP resonance band blue shifts gradually with increasing the temperature by FA The difference can be ascribed to the different heating and cooling rates betwe en the two annealing processes..

Keywords

Surface plasmon,Ag island films,Rapid thermal processing.

Citation

P CHENG, D LI, D YANG, Effect of rapid thermal processing on surface plasmon resonance of Ag island films, Optoelectronics and Advanced Materials - Rapid Communications, 5, 4, April 2011, pp.455-458 (2011).

Submitted at: March 25, 2011

Accepted at: April 11, 2011