Abstract
An analytical study of a one-dimensional photonic crystal with a defect has been presented. It is found that omni-directional reflection (with cent percent reflectivity) range of a dielectric multilayered structure can be enhanced by introducing a defect in the conventional photonic crystal (PC). In the present communication, we study the omnidirectional reflection in visible and infrared region. We choose the Si/SiO2 multilayer system for our study. It is found that introduction of a single defect in the structure considered is sufficient to increase omni-directional reflection band widths..
Keywords
Photonic crystal, Omnidirectional reflection, Multilayer system.
Citation
V. KUMAR, KH. S. SINGH, S. K. SINGH, S. P. OJHA, Design of an omni directional reflector using one dimensional photonic crystal with a single defect, Optoelectronics and Advanced Materials - Rapid Communications, 4, 1, January 2010, pp.19-22 (2010).
Submitted at: Dec. 18, 2009
Accepted at: Jan. 19, 2010