"

Cookies ussage consent

I agree.

Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.

Comparative study of structural and optical properties of thermally evaporated and pulsed laser ablated CdSe thin films

A. M. A. EL-BARRY1,* , M. M. EL- NAHASS1, A. A. ATTA1

Affiliation

  1. Thin film laboratory, Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt

Abstract

A comparison, of some structural and optical properties for pulsed laser ablated (PLA) and thermally evaporated (TE) CdSe thin films, is given. The stoichiometry of the prepared films is checked by energy dispersive X-ray spectroscopy (EDX). Electron microscope data indicate the polycrystalline nature of the films with hexagonal structure. The degree of crystallinity is improved in PLA films. Some optical parameters for the two groups of CdSe films were compared over a wide range of wavelength (~ 200 - 2500 nm) at room temperature. The analysis of the data indicates that the dispersion parameters are affected by the technique of preparation more than the absorption parameters.

Keywords

CdSe thin film, Laser ablation technique, Optical parameters.

Citation

A. M. A. EL-BARRY, M. M. EL- NAHASS, A. A. ATTA, Comparative study of structural and optical properties of thermally evaporated and pulsed laser ablated CdSe thin films, Optoelectronics and Advanced Materials - Rapid Communications, 1, 7, July 2007, pp.322-328 (2007).

Submitted at: March 13, 2007

Accepted at: June 26, 2007