Our site saves small pieces of text information (cookies) on your device in order to deliver better content and for statistical purposes. You can disable the usage of cookies by changing the settings of your browser. By browsing our site without changing the browser settings you grant us permission to store that information on your device.
PRASUN BANERJEE1,* , GAUTAM GHOSH2, SALIL KUMAR BISWAS1
The conventional cavity perturbation method of placing the sample on the broad wall of a rectangular cavity resonator is altered by placing the sample on a narrow wall of the cavity and an analytical formula is proposed for measuring the dielectric properties of medium loss materials at microwave frequencies. Advantages and limitations of the analytical technique over earlier approaches of calibration techniques are also presented..
Dielectric properties, Microwave frequencies, X-Band, Cavity perturbation method.
PRASUN BANERJEE, GAUTAM GHOSH, SALIL KUMAR BISWAS, Amendment of cavity perturbation method for measuring dielectric properties of medium loss sample at microwave frequencies, Optoelectronics and Advanced Materials - Rapid Communications, 6, 5-6, May-June 2012, pp.623-626 (2012).
Submitted at: Feb. 22, 2012
Accepted at: June 6, 2012
Optoelectronics and Advanced Materials - Rapid Communications
(2022): 0.5 - 2022 Journal Citation Reports (Clarivate Analytics, 2023)
Active accounts were imported to the new platform and assigned a random password by default. In order to access your account you need to access the login page and go through the Lost Password dialog (involves the system sending you an email with instructions) in order to reset your password. This step is necessary as passwords are kept in hashed form and the new platform uses modern hashing algorithms incompatible with the previous ones.