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Abnormal grain growth and texture evolution in 99.99% high purity aluminum foil during high and low speed annealing

YUNLEI WANG1, GUANGJIE HUANG1,* , XIONG LI1, QING LIU1,2

Affiliation

  1. College of Materials Science and Engineering, Chongqing University, Chongqing 4000 44, China
  2. National Engineering Research Centre for Magnesium Alloys, Chongqing University, Chongqing 400044, China

Abstract

Investigating recrystallization (RX) and abnormal grain growth (AGG) in high purity aluminum foil during the different heating up rates o f annealing, it generally analy s e d the evolution of m icrostructure and texture. Some of the assumptions discuss the mechanism of individual grain growth abnormal behavior involved the importance of oriented grain distribution and texture component developm ent. According to the experimental data, It show ed that the (001) plane texture oriented grain and cube texture {001} 100 > are prior to nucleat e and grow advantage than other oriented grains. The abnormal grain growth may be controlled by surface energy ef fect during the high speed annealing (HA) process and final mean grain size far surpass the 110μm of specimen thickness, which is the main ly dr iving force for grain growth after RX. However, the final average grain size is 64.3μm during the low speed annea ling (LA) process and the abnormal grain growth behavior does not occur in this foil..

Keywords

Recrystallization, AGG, Texture evolution, Aluminum foil.

Citation

YUNLEI WANG, GUANGJIE HUANG, XIONG LI, QING LIU, Abnormal grain growth and texture evolution in 99.99% high purity aluminum foil during high and low speed annealing, Optoelectronics and Advanced Materials - Rapid Communications, 9, 5-6, May-June 2015, pp.696-703 (2015).

Submitted at: Dec. 1, 2014

Accepted at: May 7, 2015