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Effects of Ar flow rate and substrate temperature on the properties of AZO thin films by RF magnetron sputtering

LINFENG LU1, HONGLIE SHEN1,* , HUI ZHANG1, FENG JIANG1, BINBIN LI1, LONG LIN1

Affiliation

  1. College of Materials Science & Technology, Nanjing University of Aeronautics & Astronautics, Nanjing, 211100, China

Abstract

Transparent conductive Al doped ZnO (AZO) thin films were deposited by radio frequency magnetron sputtering method. Using XRD rocking curves measurement, it is found that at a substrate temperature of 300 °C, the AZO has the best crystal quality. The influence of argon flow rate on growth rate, the electrical and optical properties of the AZO films prepared at 300 °C was investigated by surface profilometer, Hall measurement and UV-vis spectrometer. With increasing the argon flow rate, the growth rate decreases while the carrier concentration of the AZO films increases. Resistivity of the films presents a minimum value of 4.35×10-4 Ω·cm at the argon flow rate of 20 sccm. AZO thin film grown at this optimal Ar flow rate shows the highest Hall mobility of 31.2 cm2/V⋅s and the highest average optical transmittance of 81.6% in the 400-800 nm range..

Keywords

AZO, Magnetron sputtering, Ar flow rate, Electrical properties.

Citation

LINFENG LU, HONGLIE SHEN, HUI ZHANG, FENG JIANG, BINBIN LI, LONG LIN, Effects of Ar flow rate and substrate temperature on the properties of AZO thin films by RF magnetron sputtering, Optoelectronics and Advanced Materials - Rapid Communications, 4, 4, April 2010, pp.596-600 (2010).

Submitted at: March 21, 2010

Accepted at: April 11, 2010